Brennan, Sarah; Warren, Andrew P.; Coffey, Kevin R.; Kulkarni, Nagraj; Todd, Peter; Kilmov, Mikhail; Sohn, Yongho (2013-05-07)
The diffusion of Al in polycrystalline Mg (99.9%) was studied via depth profiling with secondary ion mass spectrometry in the temperature range of 573-673 K, utilizing the thin film method and thin film solution to the ...