In-Situ High-Throughput Synchrotron Diffraction Data of Multiple Principle Component Alloy Thin Films
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Date
2016-08-05Author
Ruiz-Yi, Benjamin
Bunn, Jonathan K.
Stasak, Drew
Mehta, Apurva
Besser, Matthew
Kramer, Matthew J.
Takeuchi, Ichiro
Hattrick-Simpers, Jason R.
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This data set is composed of a set of labeled synchrotron diffraction data taken at beamline 1-5 at SLAC on (Al1−x−yCuxMoy)FeNiTiVZr composition spread samples. The data were taken to test the relative importance of solubility and entropy in the stabilization of HEAs. The data were taken as 2-D images which were calibrated with a LaB6 standard and integrated to 1-D intensity versus q plots. Samples were annealed at various temperature and diffraction was taken in situ for various temperatures and annealing conditions. The data were labeled as either containing only a HEA phase or being polyphase.
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http://hdl.handle.net/11256/834Collections
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