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In-Situ High-Throughput Synchrotron Diffraction Data of Multiple Principle Component Alloy Thin Films

Ruiz-Yi, Benjamin; Bunn, Jonathan K.; Stasak, Drew; Mehta, Apurva; Besser, Matthew; Kramer, Matthew J.; Takeuchi, Ichiro; Hattrick-Simpers, Jason R. (2016-08-05)

This data set is composed of a set of labeled synchrotron diffraction data taken at beamline 1-5 at SLAC on (Al1−x−yCuxMoy)FeNiTiVZr composition spread samples. The data were taken to test the relative importance of ...