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Combined Near and Far Field High Energy Diffraction Microscopy Dataset for Ti-7Al Tensile Specimen Elastically Loaded In Situ

Turner, Todd J; Shade, Paul A; Bernier, Joel V; Li, Shiu Fai; Schuren, Jay C; Lind, Jonathan; Lienert, Ulrich; Kenesei, Peter; Suter, Robert M; Blank, Basil; Almer, Jonathan (2015-12-16)

High-Energy Diffraction Microscopy (HEDM) constitutes a suite of combined x-ray characterization methods, which hold the unique advantage of illuminating the microstructure and micromechanical state of a material during ...